Publications Details
Final report of Sandia National Laboratories (SNL) contribution to IAEA CRP F11016 on ''Utilization of ion accelerators for studying and modeling of radiation induced defects in semiconductors and insulator''
This is the final report of Sandia National Laboratories’ activities within the International Atomic Energy Agency (IAEA) Collaboration Research Project (CRP) F11016. The goal of this CRP is to study the effects of radiation on semiconductors and insulators with the emphasis on the effect of displacement damage due to MeV energy ions on the performance of semiconductor detectors and microelectronic devices. The devices used in this study were received from the university of Helsinki, but some other commercial diodes from Hamatsu were investigated, too. SNL’s role in the project was to perform irradiation, C-V and Ion Beam Induced Charge (IBIC) measurements on the devices. In addition we performed Binary Collision Approximation (BCA) calculations to estimate the ionization and damage of the ions used in the experiment by the members of the CRP and created a TCAD model of the irradiation of the devices.