This project aimed to identify the performance-limiting mechanisms in mid- to far infrared (IR) sensors by probing photogenerated free carrier dynamics in model detector materials using scanning ultrafast electron microscopy (SUEM). SUEM is a recently developed method based on using ultrafast electron pulses in combination with optical excitations in a pump- probe configuration to examine charge dynamics with high spatial and temporal resolution and without the need for microfabrication. Five material systems were examined using SUEM in this project: polycrystalline lead zirconium titanate (a pyroelectric), polycrystalline vanadium dioxide (a bolometric material), GaAs (near IR), InAs (mid IR), and Si/SiO 2 system as a prototypical system for interface charge dynamics. The report provides detailed results for the Si/SiO 2 and the lead zirconium titanate systems.
Automated vehicles (AV) hold great promise for improving safety, as well as reducing congestion and emissions. In order to make automated vehicles commercially viable, a reliable and highperformance vehicle-based computing platform that meets ever-increasing computational demands will be key. Given the state of existing digital computing technology, designers will face significant challenges in meeting the needs of highly automated vehicles without exceeding thermal constraints or consuming a large portion of the energy available on vehicles, thus reducing range between charges or refills. The accompanying increases in energy for AV use will place increased demand on energy production and distribution infrastructure, which also motivates increasing computational energy efficiency.