Publications

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The utility of automated high-throughput tensile testing to reveal stochastic process parameter sensitivity

Materials Science and Engineering A

Nathan Heckman, Thomas Ivanoff, Ashley [UCSB] Roach, Bradley Howell Jared, Daniel Joseph Tung, Todd Huber, David J. Saiz, Joshua Robert Koepke, Jeffrey Rodelas, Jonathan D Madison, Bradley Salzbrenner, Laura Painton Swiler, Reese E. Jones, Brad Boyce

https://www.osti.gov/search/identifier:1581976

Journal Article – 2019 Journal Article 2019

The Influence of Defects on the Performance of 316L Stainless Steel from Metal L-PBF

DOE/NNSA AM Workshop

Bradley Howell Jared, Brad Boyce, Jonathan D Madison, Jeffrey Rodelas, David J. Saiz, Joshua Robert Koepke, Todd Huber, Thomas Ivanoff, Bradley Salzbrenner, Burke Lloyd Kernen, David G. Moore, Laura Painton Swiler

https://www.osti.gov/search/identifier:1648746

Display or Poster (non-conference) – 2019 Display or Poster (non-conference) 2019

The Influence of Defects on the Performance of 316L Stainless Steel from Metal Laser Powder Bed Fusion

Solid Freeform Fabrication

Bradley Howell Jared, Jonathan D Madison, Jeffrey Rodelas, Daniel Joseph Tung, Laura Painton Swiler, David J. Saiz, Brad Boyce, Joshua Robert Koepke, Todd Huber, Thomas Ivanoff, Nathan Heckman, Harlan James Brown-Shaklee, Burke Lloyd Kernen

https://www.osti.gov/search/identifier:1582145

Conference Paper – 2018 Conference Paper 2018

Defect Detection in Metal Additive Manufacturing Through Application of In-Situ Diagnostics

Tms 2019

Bradley Howell Jared, Jonathan D Madison, Laura Painton Swiler, Thomas Ivanoff, Burke Lloyd Kernen, Jay D. Carroll, Todd Huber

Abstract – 2018 Abstract 2018

The Influence of Defects on the Performance of 316L Stainless Steel from Metal Laser Powder Bed Fusion

Solid Freeform Fabrication

Bradley Howell Jared, Brad Boyce, Jonathan D Madison, Jeffrey Rodelas, Daniel Joseph Tung, Laura Painton Swiler, David J. Saiz, Joshua Robert Koepke, Todd Huber, Thomas Ivanoff

Abstract – 2018 Abstract 2018
Document Title Type Year