Publications

1 Result
Date Inputs. Currently set to enter a start and end date.
–
Current Filters Clear all
Publication Type Year

Assessing atomically-thin delta-doping of silicon using mid-IR ellipsometry

Journal of Materials Research

Aaron Michael Katzenmeyer, Ting S. Luk, Ezra Bussmann, Steve Michael Young, Evan Mark Anderson, Michael Thomas Marshall, James A. Ohlhausen, Paul G. Kotula, Ping Lu, DeAnna Marie Campbell, Tzu-Ming Lu, Peter Liu, Dan Ward, Shashank Misra

https://www.osti.gov/search/identifier:1644064

Journal Article – 2020 Journal Article 2020
Document Title Type Year