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Center for Computing Research

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Publication	Type	Year
Direct-Levelling Finite Element Analysis Data for Material Model Calibration using Digital Image Correlation and Finite Element Model Updating IDICs Annual Conference Samuel Saiid Fayad, Elizabeth M. C. Jones, Daniel Thomas Seidl, Phillip L. Reu, John Lambros	Abstract – 2022 Abstract	2022
Finite Element Model Levelling for Material Model Calibration using Digital Image Correlation Society for Experimental Mechanics Annual Conference Samuel Saiid Fayad, Daniel Thomas Seidl, Phillip L. Reu, Elizabeth M. C. Jones, John Lambros	Conference Presentation – 2022 Conference Presentation	2022
Levelling of Finite Element Models for Material Model Calibration using Digital Image Correlation Society for Experimental Mechanics Annual Conference Samuel Saiid Fayad, Elizabeth M. C. Jones, Phillip L. Reu, Daniel Thomas Seidl, John Lambros	Conference Proceeding – 2022 Conference Proceeding	2022
Minimizing Model calibration Error from Full-Field Diagnostics Society for Experimental Mechanics Annual Conference Samuel Saiid Fayad, Elizabeth M. C. Jones, Daniel Thomas Seidl, Phillip L. Reu, John Lambros	Abstract – 2021 Abstract	2021
Sensitivity-Based Simultaneous Experimentation and Calibration of Complex Elasto-Plastic Models Society for Experiemntal Mechanics (SEM) Samuel Saiid Fayad, Elizabeth M. C. Jones, Phillip L. Reu, Daniel Thomas Seidl, John Lambros https://www.osti.gov/search/identifier:1847583	Conference Proceeding – 2021 Conference Proceeding	2021
Spatial DIC Errors due to Pattern-Induced Bias and Grey Level Discretization Experimental Mechanics Samuel Saiid Fayad, Daniel Thomas Seidl, Phillip L. Reu https://www.osti.gov/search/identifier:1574475	Journal Article – 2019 Journal Article	2019
Minimizing Pattern Induced Bias in Digital Image Correlation iDICS 2019 Samuel Saiid Fayad, Daniel Thomas Seidl, Phillip L. Reu https://www.osti.gov/search/identifier:1642830	Conference Paper – 2019 Conference Paper	2019
Pattern Induced Bias in Digital Image Correlation Society of Experimental Mechanics Samuel Saiid Fayad, Phillip L. Reu, Daniel Thomas Seidl https://www.osti.gov/search/identifier:1640639	Conference Paper – 2019 Conference Paper	2019
Pattern-Induced Bias (PIB) a "New" Error term in 2D-DIC Matching Society for Experimental Mechanics Annual Conference and Exposition Samuel Saiid Fayad, Phillip L. Reu, Richard B. Lehoucq, Daniel Z. Turner	Abstract – 2018 Abstract	2018
Document Title	Type	Year