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Characterization of Induced Defects in InAsSb from Proton Irradiation using in-situ Lifetime measurements

Research and applications of photonics in defense

Clark N. Kadlec, Michael Goldflam, Edward S. Bielejec, Emil Kadlec, Preston Thomas Webster, Evan Michael Anderson, Peter Andrew Schultz, Samuel D. Hawkins, John F. Klem, Jin K. Kim, Eric A. Shaner

https://www.osti.gov/search/identifier:1641689

Conference Paper – 2019 Conference Paper 2019

Characterization of induced defects in InAsSb from proton irradiation using in-situ lifetime measurements

Research and applications of photonics in defense

Clark N. Kadlec, Michael Goldflam, Edward S. Bielejec, Emil A. Kadlec, Preston Thomas Webster, Evan Michael Anderson, Jin K. Kim, Peter Andrew Schultz, John F. Klem, Samuel D. Hawkins, Eric A. Shaner

Abstract – 2019 Abstract 2019

Microwave Based Lifetime Measurements and Analysis for Detector Materials

IEEE Research and Applications of Photonics In Defense Conference (RAPID)

Eric A. Shaner, Clark N. Kadlec, Michael Goldflam, Edward S. Bielejec, Preston Thomas Webster, Evan Michael Anderson, Samuel D. Hawkins, Ben Olson, Emil Kadlec, Jin K. Kim, Peter Andrew Schultz, Anna Tauke-Pedretti, Wesley Thomas Coon, Torben Ray Fortune, John F. Klem

https://www.osti.gov/search/identifier:1592044

Conference Paper – 2018 Conference Paper 2018
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