Publications

Byeon, Heejun B.; Titze, Michael T.; Henshaw, Jacob D.; Harris, Charles T.; Campbell, DeAnna M.; Schultz, Peter A.; Wang, George T.; Bielejec, Edward S.; Lilly, Michael L.; Mounce, Andrew M.

Abstract not provided.

Kadlec, Clark N.; Goldflam, Michael G.; Bielejec, Edward S.; Kadlec, Emil A.; Webster, Preston T.; Anderson, Evan M.; Schultz, Peter A.; Hawkins, Samuel D.; Klem, John F.; Kim, Jin K.; Shaner, Eric A.

Abstract not provided.

Shaner, Eric A.; Kadlec, Clark N.; Goldflam, Michael G.; Bielejec, Edward S.; Webster, Preston T.; Anderson, Evan M.; Hawkins, Samuel D.; Olson, Ben O.; Kadlec, Emil A.; Kim, Jin K.; Schultz, Peter A.; Tauke-Pedretti, Anna; Coon, Wesley T.; Fortune, Torben R.; Klem, John F.

Abstract not provided.

Schultz, Peter A.; Kadlec, Clark N.; Bielejec, Edward S.; Goldflam, Michael G.; Hawkins, Samuel D.; Kim, Jin K.; Klem, John F.; Moussa, Jonathan E.; Shaner, Eric A.

Abstract not provided.

Kadlec, Clark N.; Bielejec, Edward S.; Goldflam, Michael G.; Kadlec, Emil A.; Anderson, Evan M.; Shaner, Eric A.; Kim, Jin K.; Schultz, Peter A.; Klem, John F.; Hawkins, Samuel D.

Abstract not provided.

Kadlec, Clark N.; Kadlec, Emil A.; Goldflam, Michael G.; Bielejec, Edward S.; Kim, Jin K.; Olson, B.V.O.; Klem, John F.; Hawkins, Samuel D.; Moussa, Jonathan E.; Schultz, Peter A.; Morath, C.PM.; Jenkins, G.D.J.; Cowan, V.M.C.; Shaner, Eric A.

Abstract not provided.

Bielejec, Edward S.; Kadlec, Emil A.; Kadlec, Clark N.; Goldflam, Michael G.; Shaner, Eric A.; Kim, Jin K.; Moussa, Jonathan E.; Schultz, Peter A.

Abstract not provided.

Bielejec, Edward S.; Lilly, Michael L.; Pacheco, Jose L.; Abraham, John B.; Baczewski, Andrew D.; Jacobson, Noah T.; Muller, Richard P.; Luhman, Dwight R.; Carroll, Malcolm

Abstract not provided.

Bielejec, Edward S.; Singh, Meenakshi S.; Pacheco, Jose L.; Jacobson, Noah T.; Gamble, John K.; Nielsen, Erik N.; Muller, Richard P.; Luhman, Dwight R.; Lilly, Michael L.; Carroll, Malcolm

Abstract not provided.

Pacheco, Jose L.; Bielejec, Edward S.; Singh, Meenakshi S.; Bureau-Oxton, Chloe B.; Jacobson, Noah T.; Gamble, John K.; Nielsen, Erik N.; Muller, Richard P.; Luhman, Dwight R.; Lilly, Michael L.; Carroll, Malcolm

Abstract not provided.

Bielejec, Edward S.; Pacheco, Jose L.; Singh, Meenakshi S.; Jacobson, Noah T.; Gamble, John K.; Luhman, Dwight R.; Lilly, Michael L.; Carroll, Malcolm

Abstract not provided.

Muller, Richard P.; Bishop, Nathaniel B.; Lu, Tzu-Ming L.; Pluym, Tammy P.; Bielejec, Edward S.; Lilly, Michael L.; Landahl, Andrew J.; Carroll, Malcolm; Young, Ralph W.; Nielsen, Erik N.; Rahman, Rajib R.; Witzel, Wayne W.; Gao, Xujiao G.; Tracy, Lisa A.; Bussmann, Ezra B.

Abstract not provided.

Bishop, Nathaniel B.; Stevens, Jeffrey S.; Childs, Kenton D.; Ohlhausen, J.A.; Lilly, Michael L.; Carroll, Malcolm; Young, Ralph W.; Bielejec, Edward S.; Ten Eyck, Gregory A.; Wendt, J.R.; Rahman, Rajib R.; Grubbs, Robert K.

We fabricated a split-gate defined point contact in a double gate enhancement mode Si-MOS device, and implanted Sb donor atoms using a self-aligned process. E-beam lithography in combination with a timed implant gives us excellent control over the placement of dopant atoms, and acts as a stepping stone to focused ion beam implantation of single donors. Our approach allows us considerable latitude in experimental design in-situ. We have identified two resonance conditions in the point contact conductance as a function of split gate voltage. Using tunneling spectroscopy, we probed their electronic structure as a function of temperature and magnetic field. We also determine the capacitive coupling between the resonant feature and several gates. Comparison between experimental values and extensive quasi-classical simulations constrain the location and energy of the resonant level. We discuss our results and how they may apply to resonant tunneling through a single donor.