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Publication	Type	Year
Assessing atomically-thin delta-doping of silicon using mid-IR ellipsometry Journal of Materials Research Aaron Michael Katzenmeyer, Ting S. Luk, Ezra Bussmann, Steve Michael Young, Evan Mark Anderson, Michael Thomas Marshall, James A. Ohlhausen, Paul G. Kotula, Ping Lu, DeAnna Marie Campbell, Tzu-Ming Lu, Peter Liu, Dan Ward, Shashank Misra https://www.osti.gov/search/identifier:1644064	Journal Article – 2020 Journal Article	2020
Spectroscopy and capacitance measurements of tunneling resonances in an Sb-implanted point contact Silicon S&T Quantum Computing 4th Annual Workshop Nathaniel Bishop, Harold Stalford, Ralph W. Young, Edward S. Bielejec, Gregory A. Ten Eyck, Joel R. Wendt, Rajib Rahman, Kevin Eng, Robert K. Grubbs, Jeffrey Stevens, Kenton D. Childs, James A. Ohlhausen, Michael Lilly, Malcolm S. Carroll https://www.osti.gov/search/identifier:1022986	Conference Paper – 2010 Conference Paper	2010
Document Title	Type	Year

Publication

Type

Year

Assessing atomically-thin delta-doping of silicon using mid-IR ellipsometry

Journal of Materials Research

Journal Article – 2020 Journal Article

2020

Silicon S&T Quantum Computing 4th Annual Workshop

Conference Paper – 2010 Conference Paper

2010

Document Title

Type

Year