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Assessing atomically-thin delta-doping of silicon using mid-IR ellipsometry

Journal of Materials Research

Aaron Michael Katzenmeyer, Ting S. Luk, Ezra Bussmann, Steve Michael Young, Evan Mark Anderson, Michael Thomas Marshall, James A. Ohlhausen, Paul G. Kotula, Ping Lu, DeAnna Marie Campbell, Tzu-Ming Lu, Peter Liu, Dan Ward, Shashank Misra

Journal Article – 2020 Journal Article 2020

Spectroscopy and capacitance measurements of tunneling resonances in an Sb-implanted point contact

Silicon S&T Quantum Computing 4th Annual Workshop

Nathaniel Bishop, Harold Stalford, Ralph W. Young, Edward S. Bielejec, Gregory A. Ten Eyck, Joel R. Wendt, Rajib Rahman, Kevin Eng, Robert K. Grubbs, Jeffrey Stevens, Kenton D. Childs, James A. Ohlhausen, Michael Lilly, Malcolm S. Carroll

Conference Paper – 2010 Conference Paper 2010
Document Title Type Year