Third LEEM/PEEM Workshop
General Information
Local Committee
General Committee
Future Sites
First LEEM Workshop

The First LEEM Workshop was held in Tempe, Arizona, USA on April 7-9, 1998.  The meeting was organized by Prof. Ernst Bauer of the Arizona State University.  The stated purpose of the 1st LEEM Workshop was to review the state of the art in LEEM and to make links to related techniques.  The meeting attracted 40 researchers from eight countries who spoke on topics including instrumentation (LEEM basics, electron energy analyzers, spin polarized LEEM, x-ray magnetic dichroism microscopy); applications (epitaxial growth, surface etching, catalysis, surface self-assembly, phase transitions, step dynamics, magnetic storage); theory (contrast mechanisms, layer spacing determination); and future directions (free-electron-laser PEEM, the SMART spectromicroscope).  The proceedings of the first LEEM Workshop were published in a special issue of Surface Review and Letters (Vol. 5, No. 6). 
 
 

Second LEEM/PEEM Workshop

The Second LEEM/PEEM Workshop was held in Paris, France on September 26-28, 2000.  The meeting was organized by Dr. Hans-Joachim Ernst of the Commissariat l'Ènergie Atomique (CEA) in Saclay, France. The title of the workshop was changed to include PEEM specifically as a topic of the meeting.   To broaden the scope of the workshop, six researchers from scientific disciplines outside LEEM/PEEM, but with overlapping or complementary interests were invited.  These invited speakers were designated as Distinguished Guest Lecturers and made a significant contribution to the success of the meeting.  The number of attendees was again 40.  The three-day workshop consisted of the six Distinguished Guest Lectures and 28 contributed talks from speakers working directly with LEEM and PEEM.  The topics covered by the Distinguished Guest Lecturers included ultrahigh vacuum scanning electron microscopy, low energy electron diffraction, x-ray scanning microscopy, photoelectron diffraction, spin-resolved scanning tunneling microscopy, and reflection electron microscopy.  The general areas covered by the contributed talks were thin-film growth and surface phenomena; recent experimental, theoretical and technological developments; and surface magnetism.  The proceedings of the second LEEM/PEEM Workshop were published in a special issue of Surface Science (Vol. 480, No. 3).
 
 
 
 
 
 
 
 
 
 
 


This page last updated on Thursday, January 17, 2002

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