Manufacturing Science and Technology: Technologies

Dielectric Characterization

The Manufacturing Science & Technology Center provides a broad range of dielectric characterization for electroceramics either in bulk or thin film form. Special emphasis is placed on the dielectric characterization on ferroelectrics, varistor ceramics, and thick film materials. Quick system integration, combined with our expertise in data acquisition enables us to perform specialized tasks beyond basic dielectric characterization within limited time constraints.

Capabilities

Perform basic dielectric characterization as a function of temperature, frequency, and dc bias
Determine the ac and dc conductivity, characteristics of polarization reversal, field-induced electromechanical responses, and piezoelectric coefficients
Measure the current-voltage characteristics for varistor materials
Perform unique system integration and data acquisition for material characterization
Correlate ceramic performance to processing, microstructure and electrical properties

Resources

Precision Inductance/Capacitance/Resistance meter
Impedance/Gain-Phase Analysis
Polarization Hysteresis Tester
High Power Pulse Generator
Piezoelectric Meter
Environmental Test Chamber
Data Acquisition System

Accomplishments

Established a basic understanding of the hot pole cracking problem experienced in current stack production. An unusual field-enhanced strain was identified during the high temperature to low temperature rhombohedral phase transformation. This unusual behavior contributed to low production yields in the past few years. A no-cost hot poling process modification has improved our production yield from 68% to greater than 92%.
Developed a correlation between processing, microstructure and electric properties of buried resistors in low temperature co-fired ceramics. Expertise in this area is expanding for the development of integrated bias resistor applications.
Established a web-based database for the chem-prep 95/5 PZT ferroelectric ceramics. The database consists of processing, microstructure, and dielectric property information to aid overall voltage bar component development efforts.
Developing non-destructive crack detection techniques for active ceramic components.

Dielectric Characterization Related Publications:

P. Yang, R. H. Moore, and G. R. Burns, "Field-enhanced piezoelectric deformation during the high temperature/low temperature rhombohedral phase transformation for tin modified lead zirconate titanate ceramics," J. Appl. Phys., 91 [12], 10028-10031, (2002). (PDF coming soon)
B. A. Tuttle, P. Yang, J. H. Gieske, J. A. Voigt, T. W. Scofield, D. H. Zeuch, and W. R. Olson, "Pressure-induced phase transformation of controlled-prosity Pb(Zr0.95Ti0.05)O3 ceramics," J. Am. Ceram. Soc., 84 [6], J. Am. Ceram. Soc., 84 [6], 1260-1264, (2001). (PDF coming soon)
P. Yang, M. A. Rodriguez, P. Kotula, B. K. Miera, and D. Dimos, "Processing, microstructure, and electric properties of buried resistors in low temperature co-fired ceramics," J. Appl. Phys., 89 [7], 4175-4182, (2001). (PDF coming soon)
M. A. Rodriguez, P. Yang, P. Kotula, and D. Dimos, "Microstructure and phase development of buried resistors in low temperature co-fired ceramics," J. Electroceramics, 5:3, 217-223, (2000). (PDF coming soon)
P. Yang, D. Dimos, M. A. Rodriguez, R. F. Huang, S. Dai, D. Wilcox, "Direct-write precision resistors for ceramic packages," Mat. Res. Soc. Symp. Proc., Vol. 542, Edited by M. Cima, S. Danforth, and D. Dimos, 159-164, (1999).
D. Dimos and P. Yang, "Direct-write fabrication of integrated, multiplayer ceramic components," Electronic Components and Technology Conference, May 25 at Seattle, WA, p.4-7, (1998).
D. Dimos and P. Yang, "Direct-write technique simplifies fabrication of thick-film hybrids," Ceramic Industry, Dec. (1997).
P. Yang and D. A. Payne, "The effect of external field symmetry on the antiferroelectric-ferroelectric phase transformation," J. Appl. Phys., 80 [7] 4001-4005, (1996). (PDF coming soon)
Pin Yang, Bruce A. Tuttle, Roger H. Moore, James A. Voigt, Tim W. Scofield, and Steve J. Lockwood, "Chem-Prep PZT95/5 for Neutron Generator Applications: The Effect of Pore Former Type and Density on the Depoling Behavior of Chemically Prepared PZT 95/5 Ceramics," SAND2003-3866, (2003). (PDF format -1,608 KB)
Pin Yang, George R. Burns, and Mark A. Rodriguez, "Field-Induced Strain Associated with Polarization Reversal in a Rhombohedral Ferroelectric Ceramic," J. Mater. Res. Vol. 18, No. 12, 2869-2873, (2003). (website: PDF format -112 KB)

Contacts:
Pin Yang
Roger Moore

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Dielectric Characterization